Novel Optics, Ningbo Yongxin Optics Co., Ltd.

NX1000 Industrial‑Inspection Microscope

Optimized for microelectronics and semiconductor inspection. Frequently‑used controls are positioned close to the operator for fast, convenient adjustments during observation. Supplied with an erect‑image tube, delivering better synchronization between stage movement and viewing compared with traditional inverted‑image tubes.

Overview

Convenient Observation for Industrial Samples with High‑fidelity Imaging

Clutch-Equipped Stage Handle

Fast and slow movement modes for large-area positioning. Paired with fine-adjust handle for precise, quick sample location.

Built-In Control Panel

Buttons mapped to specific objectives — one press changes magnification.

Imaging Software for High‑quality Image Acquisition, Processing and Analysis

Image stitching

Depth-of-field fusion / 3D reconstruction

Optimized for FPD and LSI Samples

Oversized Stage

Microelectronics and semiconductor samples are often large; conventional metallographic stages fall short. NX1000 offers oversized stage and travel with smooth movement — ideal for large-area industrial inspection.

Anti-Static Dust Shield

Industrial samples are dust-sensitive. Large anti-static protective cover.

Long-WD, High-NA Objectives
Electronic components and semiconductors create large height differences on circuit boards — dedicated long-WD objectives.

Multiple Observation Modes to Meet Diverse Inspection Requirements

Epi-Brightfield

NIS infinity-corrected system. Uniform, bright, high-color-fidelity viewing. For opaque samples such as semiconductors.

Darkfield

Bright darkfield observation for high-sensitivity detection of fine scratches and defects. For high-spec surface inspection.

Transmitted Brightfield

For transparent samples (FPD, optical components) via transmitted-light condenser. Also pairs with DIC and simple polarization.